Infrared and Laser Engineering, Volume. 47, Issue 9, 917003(2018)

Detection efficiency calibraion of CsI(TI) scintillator with 2 000-2 800 eV soft X-ray incidence

Wang Jing1... Zhang Wenhai1, Yang Guohong1, Wei Minxi1 and Zheng Lei2 |Show fewer author(s)
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    Wang Jing, Zhang Wenhai, Yang Guohong, Wei Minxi, Zheng Lei. Detection efficiency calibraion of CsI(TI) scintillator with 2 000-2 800 eV soft X-ray incidence[J]. Infrared and Laser Engineering, 2018, 47(9): 917003

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    Paper Information

    Category: 光电测量

    Received: Apr. 10, 2018

    Accepted: May. 20, 2018

    Published Online: Oct. 6, 2018

    The Author Email:

    DOI:10.3788/irla201847.0917003

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