Acta Photonica Sinica, Volume. 52, Issue 6, 0604001(2023)

Effect of Zn Diffusion on Avalanche Breakdown Probability of InGaAs/InP Single Photon Avalanche Diodes

Kefei GUO1,2, Fei YIN1,2, Liyu LIU1,2, Kai QIAO1,2, Ming LI1, Tao WANG1,2, Mengyan FANG1,2, Chao JI1,2, Youshan QU1,2, Jinshou TIAN1,2, and Xing WANG1,2、*
Author Affiliations
  • 1Key Laboratory of Ultrafast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Kefei GUO, Fei YIN, Liyu LIU, Kai QIAO, Ming LI, Tao WANG, Mengyan FANG, Chao JI, Youshan QU, Jinshou TIAN, Xing WANG. Effect of Zn Diffusion on Avalanche Breakdown Probability of InGaAs/InP Single Photon Avalanche Diodes[J]. Acta Photonica Sinica, 2023, 52(6): 0604001

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    Paper Information

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    Received: Dec. 28, 2022

    Accepted: Feb. 20, 2023

    Published Online: Jul. 27, 2023

    The Author Email: WANG Xing (wangxing@opt.ac.cn)

    DOI:10.3788/gzxb20235206.0604001

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