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Acta Optica Sinica, Volume. 33, Issue 5, 512003(2013)

Comparison of Bidirectional Reflectance Distribution Function of Aluminum Alloy with Different Processing Technologies in Space Camera

Li Yongqiang1,2、*, Guo Yongxiang2, Liao Zhibo2, Wang Jingyi2, and Du Jianxiang2
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    [1] [1] Cao Yunhua, Wu Zhensen, Zhang Hanlu et al.. Experimental measurement and statistical modeling of spectral bidirectional reflectance distribution function of rough target samples [J]. Acta Optica Sinica, 2008, 28(4): 792～798

    [2] [2] Li Xin, Zheng Xiaobing, Xun Li′na et al.. Realization of field BRDF acquisition by multiangular measurement system [J]. Opto-Electronic Engineering, 2008, 35(1): 66～70

    [3] [3] Yang Yufeng, Wu Zhensen, Cao Yunhua. Scattering characteristics of complex background infrared radiation from a non-lambertian target [J]. Infrared and Laser Engineering, 2011, 40(5): 800～804

    [4] [4] Wu Zhensen, Xie Donghui, Xie Pinhua et al.. Modeling reflectance function from rough surface and algorithms [J]. Acta Optica Sinica, 2002, 22(8): 897～901

    [5] [5] Jia Hui, Li Futian. Bidirectional reflectance distribution function of aluminum diffuser at UV spectral band [J]. Acta Optica Sinica, 2004, 24(2): 230～234

    [6] [6] Feng Weiwei, Wei Qingnong, Wang Shimei et al.. Study of polarized bidirectional reflectance distribution function model for painted surfaces [J]. Acta Optica Sinica, 2008, 28(2): 290～294

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    Li Yongqiang, Guo Yongxiang, Liao Zhibo, Wang Jingyi, Du Jianxiang. Comparison of Bidirectional Reflectance Distribution Function of Aluminum Alloy with Different Processing Technologies in Space Camera[J]. Acta Optica Sinica, 2013, 33(5): 512003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 24, 2012

    Accepted: --

    Published Online: Apr. 9, 2013

    The Author Email: Yongqiang Li (99yongqiang@163.com)

    DOI:10.3788/aos201333.0512003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology