Infrared and Laser Engineering, Volume. 52, Issue 8, 20230385(2023)
Projection chromatic aberration modeling and correction of phase measurement profilometry based on phase target
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Yuzhuo Zhang, Lulu Jia, Nan Gao, Zhaozong Meng, Zonghua Zhang. Projection chromatic aberration modeling and correction of phase measurement profilometry based on phase target[J]. Infrared and Laser Engineering, 2023, 52(8): 20230385
Category: Photoelectric measurement
Received: Jun. 28, 2023
Accepted: --
Published Online: Oct. 19, 2023
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