Infrared and Laser Engineering, Volume. 52, Issue 8, 20230385(2023)

Projection chromatic aberration modeling and correction of phase measurement profilometry based on phase target

Yuzhuo Zhang, Lulu Jia, Nan Gao, Zhaozong Meng, and Zonghua Zhang
Author Affiliations
  • School of Mechanical Engineering, Hebei University of Technology, Tianjin 300130, China
  • show less
    References(16)

    [10] P P Sun, Q Xue, W Ji, et al. Analysis and compensation of lateral chromatic aberration of structured light 3D measurement system. Optics Communications, 488, 126871(2021).

    [12] Z Li, Y Shi, C Wang, et al. Accurate calibration method for a structured light system. Optical Engineering, 47, 525-534(2008).

    Tools

    Get Citation

    Copy Citation Text

    Yuzhuo Zhang, Lulu Jia, Nan Gao, Zhaozong Meng, Zonghua Zhang. Projection chromatic aberration modeling and correction of phase measurement profilometry based on phase target[J]. Infrared and Laser Engineering, 2023, 52(8): 20230385

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Photoelectric measurement

    Received: Jun. 28, 2023

    Accepted: --

    Published Online: Oct. 19, 2023

    The Author Email:

    DOI:10.3788/IRLA20230385

    Topics