Journal of Semiconductors, Volume. 44, Issue 3, 032801(2023)

Investigation of UV photosensor properties of Al-doped SnO2 thin films deposited by sol-gel dip-coating method

Kaour Selma1,2, Benkara Salima3,4、*, Bouabida Seddik3, Rechem Djamil1,3, and Hadjeris Lazhar1,2
Author Affiliations
  • 1Laboratory of Materials and Structure of Electromechanical Systems and their Reliability, Oum El Bouaghi University, Algeria
  • 2Faculty of Exact Sciences and Natural and Life Sciences, Oum El Bouaghi University, Algeria
  • 3Electrical Engineering Department, Oum El Bouaghi University, Algeria
  • 4Laboratory of Active Components and Materials, Oum El Bouaghi University, Algeria
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    Figures & Tables(13)
    (Color online) The schematic drawing of pure and Al-doped SnO2 thin films produced with a sol-gel dip coating method.
    (Color online) Experimental setup of UV photo-detection.
    (Color online) XRD patterns of undoped and Al-doped SnO2 thin films.
    (Color online) 3D surface morphologies of SnO2 thin films with various Al doping concentrations.
    (Color online) Optical transmittance spectra of undoped and Al-doped SnO2 thin films.
    (Color online) Plots(αhυ)2 versushυ of undoped and Al-doped SnO2 thin films.
    (Color online) Variation of (a) dark current and (b) photocurrent as a function of applied voltage for undoped and aluminum doped SnO2 thin films.
    (Color online) Photoconductivity rise and decay time spectra of undoped and Al-doped SnO2 thin films.
    (Color online) A schematic of the photoresponse mechanism and energy band diagram of Al:SnO2 thin films.
    (Color online) Rise and decay photoresponse curves of pure and Al-doped SnO2 thin films.
    • Table 0. XRD parameters, crystallite size, strain and RMS of undoped and Al-doped SnO2 thin films.

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      Table 0. XRD parameters, crystallite size, strain and RMS of undoped and Al-doped SnO2 thin films.

      Sample2θ (°)Β (°)D (nm)Strain (10−3)a =b (Å)c (Å)RMS (nm)Ra (nm)Da (nm)
      SnO226.790.7111.923.274.7003.2035.064.2573.0
      3 wt.% Al-SnO226.560.7411.403.424.7423.1952.321.7645.5
      5 wt.% Al-SnO226.580.9908.544.604.7383.1612.011.6729.3
    • Table 0. The values of photocurrent, dark current,ION/IOFF ratio, rise time constant (tr), decay time constants (td1,td2) and defect levels energy (trap depth (E1,E2)) for undoped and Al-doped SnO2 thin films.

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      Table 0. The values of photocurrent, dark current,ION/IOFF ratio, rise time constant (tr), decay time constants (td1,td2) and defect levels energy (trap depth (E1,E2)) for undoped and Al-doped SnO2 thin films.

      SampleION (A)IOFF (A)ION/IOFFtr (s)td1 (s)td2 (s)E1 (eV)E2 (eV)Ref.
      SnO21.22 × 10−27.75 × 10−5217.852811.3373.140.5980.64This work
      3 wt.% Al-SnO23.56 × 10−41.30 × 10−6273.84155.6448.150.5800.63This work
      5 wt.% Al-SnO23.03 × 10−61.95 × 10−8155.38245.3349.940.5790.63This work
      Mg-ZnO films8.4919614.3112.10.6400.70[68]
      Cu/LiZnO9.6 × 10−111.20 × 10−7125076935222[69]
      SnO2films3.2×10−111.43 × 10−944250506[39]
    • Table 0. The values of Texture Coefficient of undopedand Al-doped SnO2 thin films.

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      Table 0. The values of Texture Coefficient of undopedand Al-doped SnO2 thin films.

      SampleTc(hkl) of SnO2 thin films
      (110)(101)(200)(210)
      SnO21.221.170.780.83
      3 wt.% Al-SnO21.410.940.860.77
      5 wt.% Al-SnO21.331.120.620.91
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    Kaour Selma, Benkara Salima, Bouabida Seddik, Rechem Djamil, Hadjeris Lazhar. Investigation of UV photosensor properties of Al-doped SnO2 thin films deposited by sol-gel dip-coating method[J]. Journal of Semiconductors, 2023, 44(3): 032801

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    Paper Information

    Category: Articles

    Received: Sep. 10, 2022

    Accepted: --

    Published Online: Mar. 30, 2023

    The Author Email: Salima Benkara (sali_benkara@yahoo.fr)

    DOI:10.1088/1674-4926/44/3/032801

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