Chinese Optics Letters, Volume. 18, Issue 11, 113401(2020)

High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal

Jun Shi1, Tong Yao2, Miao Li2、*, Guohong Yang3, Minxi Wei3, Wanli Shang3, and Feng Wang3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China
  • show less
    References(18)

    [1] B. Yu, J. M. Yang, T. X. Huang, P. Wang, W. L. Shang, X. M. Qiao, X. W. Deng, Z.W. Zhang, Z. F. Song, Q. Tang, X. S. Peng, J. B. Chen, Y. L. Li, W. Jiang, L. D. Pu, J. Yan, Z. J. Chen, Y. S. Dong, W. D. Zheng, F. Wang, S. E. Jiang, Y. K. Ding, J. Zheng. Chin. Phys. B, 28, 298(2019).

    [6] J. Shi, G. H. Peng, S. L. Xiao, J. Y. Qian. Chin. J. Sci. Instrum., 12, 2761(2012).

    [10] A. P. Shevelko, A. A. Antonov, I. G. Grigorieva, Y. S. Kasyanov, L. V. Knight, A. R. Mena, C. Turner, Q. Wang, O. F. Yakushev. Proc. SPIE, 4144, 148(2000).

    [11] A. P. Shevelko. Proc. SPIE, 91, 3406(1998).

    [12] A. P. Shevelko, A. A. Antonov, I. G. Grigorieva, O. Yakushev, L. V. Knight, Q. Wang. Adv. X-ray Analysis, 45, 433(2002).

    [18] X. H. Yuan, D. C. Carroll, M. Coury, R. J. Gray, C. M. Brenner, X. X. Lin, Y. T. Li, M. N. Quinn, O. Tresca, B. Zielbauer, D. Neely, P. McKenna. Phys. Res. A, 653, 145(2011).

    CLP Journals

    [1] Ke Li, Yantao Gao, Haipeng Zhang, Guohao Du, Hefei Huang, Hongjie Xu, Tiqiao Xiao. Efficient three-dimensional characterization of C/C composite reinforced with densely distributed fibers via X-ray phase-contrast microtomography[J]. Chinese Optics Letters, 2021, 19(7): 073401

    Cited By
    Tools

    Get Citation

    Copy Citation Text

    Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang. High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal[J]. Chinese Optics Letters, 2020, 18(11): 113401

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: X-ray Optics

    Received: May. 14, 2020

    Accepted: Aug. 18, 2020

    Published Online: Sep. 29, 2020

    The Author Email: Miao Li (limiao@cqupt.edu.cn)

    DOI:10.3788/COL202018.113401

    Topics