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Opto-Electronic Engineering, Volume. 31, Issue 10, 39(2004)

Fast Fourier transform profilometry based on two-frequency grating projection

[in Chinese]... [in Chinese], [in Chinese] and [in Chinese] |Show fewer author(s)
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    [1] [1] TAKEDA M,MOTOH K.Fourier transform profilometry for the automatic measurement of 3-D object shapes [J].Appl.Opt,1983,22(24):3977-3982.

    [2] [2] SU Xian-yu,CHEN Wen-jing.Fourier transform profilometry:.a review [J].Optics and Lasers in Engineering,2001,35(5):263-284.

    [4] [4] LI Jie-lin,SU Hong-jun,SU Xian-yu.Two-frequency grating used in phase measuring profilometry[J].Appl.Opt,1997,36(1):277-280.

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    [2] Yang Chuping, Weng Jiawen, Zhao Jing, Yang Yi. Extract Original Grating Information from Deformed Grating Pattern[J]. Acta Optica Sinica, 2009, 29(11): 3078

    [3] XIN Xue-cheng, ZHANG Yu-dong, LI Guo-jun, WANG Jiong, LUO Xian-gang. Differential Interference Contrast Method Based on Bi-frequency Grating[J]. Opto-Electronic Engineering, 2011, 38(6): 78

    [4] QIAO Nao-sheng, ZHAO Hua-jun, YAO Chun-mei, CAI Xin-hua, PENG Guang-han. Overlapping Caused by Fourier Transformation Profilometry Based on Tow-frequency Grating[J]. Acta Photonica Sinica, 2009, 38(2): 356

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Fast Fourier transform profilometry based on two-frequency grating projection[J]. Opto-Electronic Engineering, 2004, 31(10): 39

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    Paper Information

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    Received: Feb. 1, 2004

    Accepted: --

    Published Online: Nov. 14, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology