THE EFFECT OF THE THICKNESS OF PHOTOPOLYMER ON HIGH-DENSITY HOLOGRAPHIC RECORDING PARAMETERS

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Photonica Sinica, Volume. 31, Issue 2, 246(2002)

[in Chinese]^1,2, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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References(6)

[3] [3] Lerner E J.Holographic data storage chips away at barriers.Laser Focus World, 2000,(1):209～214

[5] [5] Hong J H,et al.Volum holographic memory systems:techniques and architectures.Opt Eng ,1995,34(8):2193～2203

[6] [6] Pu A, Psaltis D. High-density recording in photopolymer-based holographic three-dimensional disks.Appl Opt,1996,35(14):2389～2398

[7] [7] Ma Jian,Chang T, Choi S, Hong J. Ruggedized digital holographic data storage with fast access.Optical and Quantum Electronics .2000,32(2):383～392

[8] [8] Pu A, Curtis K,Psaltis D.Exposure schedule for multiplexing holograms in photopolymer films .Opt Eng,1996,35(10):2824～2829

[9] [9] Kogelnik H.Coupled wave theory for thick hologram gratings.The Bell System Technical Journal,1969,48(9):2909～2947

CLP Journals

[1] Duan Xiaoya, Zhu Jianhua, Wei Tao, Chen Qianqian, Wei Naike. Recipe Optimization and Holographic Storage Characteristics of Green Sensitive Polyvinyl Alcohol/Acrylamide-Based Photopolymer[J]. Chinese Journal of Lasers, 2009, 36(4): 983

[2] XIAO Yong, TANG Dao-guang, CHEN Ke, CHENG Jian-qun, HUANG Ming-ju. Holographic Recording Photopolymer Sensitive to Broad Wavelenth from Violet to Red Light[J]. Acta Photonica Sinica, 2009, 38(3): 630

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. THE EFFECT OF THE THICKNESS OF PHOTOPOLYMER ON HIGH-DENSITY HOLOGRAPHIC RECORDING PARAMETERS[J]. Acta Photonica Sinica, 2002, 31(2): 246

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Paper Information

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Received: Jun. 20, 2001

Accepted: --

Published Online: Sep. 18, 2007

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology