Infrared and Laser Engineering, Volume. 49, Issue 8, 20200072(2020)

Filter-based technology for evaluating proportions of high-order harmonics and its application

Ao Sun, Huabing Du*, Lifei Hou, Wanli Shang, Xingsen Che, Wenhai Zhang, Minxi Wei, Guohong Yang, Rongqing Yi, Yimeng Yang, Shaoen Jiang, Feng Wang, and Jiamin Yang
Author Affiliations
  • Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
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    [5] [5] Tirsell K G, Knblum H N, Slivinsky V W. Time resolved, subkeV Xray measurements using filtered Xray diodes[COL].(19790818)[20200120].https:www.osti.govbiblio5481965

    [7] Kexu Sun, 孙可煦, Jianguo Yang, 杨建国, 郑志坚, Zhijian Zheng. A sub-keV X-ray spectrometer used in laser plasma interaction experiments. High Power Laser and Particle Beams, 2, 16-22(1990).

    [8] 易荣清, Rongqing Yi, 赵屹东, Yidong Zhao, Qiuping Wang, 王秋平. Characteristic study and application of the soft X-ray beam line 4B7B on BSRF. Acta Optica Sinica, 34, 345-350(2014).

    [11] T Zhu, W L Shang, W H Zhang. Quantitative measurement of the proportions of high-order harmonics for the 4B7B soft-X-ray source at Beijing Synchrotron Radiation Facility. Plasma Science and Technology, 15, 1194-1196(2013).

    [12] 易荣清, Rongqing Yi, Kexu Sun, 孙可煦, 王洪斌, Hongbin Wang. Absolute calibration of sensitivity of XRD on the synchrotron radiation source. High Power Laser and Particle Beams, 8, 563-569(1996).

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    Ao Sun, Huabing Du, Lifei Hou, Wanli Shang, Xingsen Che, Wenhai Zhang, Minxi Wei, Guohong Yang, Rongqing Yi, Yimeng Yang, Shaoen Jiang, Feng Wang, Jiamin Yang. Filter-based technology for evaluating proportions of high-order harmonics and its application[J]. Infrared and Laser Engineering, 2020, 49(8): 20200072

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    Paper Information

    Category: 光电测量

    Received: Feb. 26, 2020

    Accepted: --

    Published Online: Dec. 31, 2020

    The Author Email: Du Huabing (duhb@outlook.com)

    DOI:10.3788/IRLA20200072

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