Waveplate Parameter Measurement Based on Dual Photoelastic Modulators Cascade Differential Frequency Modulation

Shuang WANG; Zhiying CUI; Huajun FENG; Kewu LI; Zhibin WANG

doi:10.3788/gzxb20235211.1112002

Acta Photonica Sinica, Volume. 52, Issue 11, 1112002(2023)

Waveplate Parameter Measurement Based on Dual Photoelastic Modulators Cascade Differential Frequency Modulation

Shuang WANG^1,2,3,4, Zhiying CUI^2,4, Huajun FENG^2,4, Kewu LI^1,2,3,4、*, and Zhibin WANG^3、**

Author Affiliations

¹School of Data Science and Technology，North University of China，Taiyuan 030051，China

²Ningbo Yongxin Optics Co.，Ltd，Ningbo 315040，China

³Engineering and Technology Research Center of Shanxi Province for Opto-electric Information and Instrument，North University of China，Taiyuan 030051，China

⁴College of Optical Science and Engineering，Zhejiang University，Hangzhou 310014，China

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Figures & Tables(7)

Fig. 1. Schematic diagram of the measurement of wave plate parameter

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Fig. 2. Bessel series

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Fig. 3. Digital phase lock result of modulation light signals.

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Fig. 4. Measurement results of 1/4 wave plate

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Fig. 5. Measurement results of wave plate for 532 nm

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Table 1. Comparison with reported measurement methods of waveplate parameters

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Table 1. Comparison with reported measurement methods of waveplate parameters

Methods	Standard deviation of fast-axis azimuth $σ_{θ}$	Standard deviation of retardation	Measurement time	References
Polarization compensation	0.1°	±5 nm（±4.96×10^-2 rad @632.8 nm）	1 min	［6］
Interferometry	0.22°	0.37°（6.48×10^-3 rad）	1 s	［7］
Laser feedback	-	0.12°（2.09×10^-3 rad）	-	［8-9］
Dual photoelastic modulators cascade differential frequency modulation	0.02°	5.64×10^-4 rad	200 ms	This work

Table 2. Wave plate retardance parameter

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Table 2. Wave plate retardance parameter

Wave plate specimens	Measurements of phase retardation（@632.8 nm）/rad	Measurements of retardance $Δ = \frac{(n_{e} (λ) - n_{o} (λ)) λ_{0} ϕ_{0}}{2 π (n_{e} (λ_{0}) - n_{o} (λ_{0}))}$ /nm	Theoretical value of retardance/nm	Deviation/nm
632.8 nm 1/4 wave plate	1.572 7	158.39（@ λ=632.8 nm）	158.2	0.19
532 nm 1/4 wave plate	1.313 8	134.17（@ λ=532 nm）	133	1.17
532 nm 1/2 wave plate	2.597 8	265.30（@ λ=532 nm）	266	-0.7

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Shuang WANG, Zhiying CUI, Huajun FENG, Kewu LI, Zhibin WANG. Waveplate Parameter Measurement Based on Dual Photoelastic Modulators Cascade Differential Frequency Modulation[J]. Acta Photonica Sinica, 2023, 52(11): 1112002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Apr. 18, 2023

Accepted: May. 25, 2023

Published Online: Dec. 22, 2023

The Author Email: LI Kewu (kewuli@nuc.edu.cn), WANG Zhibin (wangzhibin@nuc.edu.cn)

DOI:10.3788/gzxb20235211.1112002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology