Semiconductor Optoelectronics, Volume. 44, Issue 4, 504(2023)

CCD Charge Transfer Model and Applications Based on SRH Theory

YAN Xiaopeng1,2, WEI Jun1,2、*, and TANG Yuyu1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(9)

    [3] [3] Israel H, Massey R, Prodhomme T, et al. How well can charge transfer inefficiency be corrected? A parameter sensitivity study for iterative correction[J]. Monthly Notices of the Royal Astronomical Society, 2015, 453(1): 561-580.

    [4] [4] Hall D J, Murray N J. Determination of in situ trap properties in CCDs using a “Single-Trap Pumping” technique[J]. IEEE Trans. on Nuclear Science, 2014, 61(4): 1826-1833.

    [5] [5] Massey R, Israel H, Schrabback T, et al. An improved model of charge transfer inefficiency and correction algorithm for the Hubble space telescope[J]. Monthly Notices of the Royal Astronomical Society, 2014, 439(1): 887-907.

    [6] [6] Baggett S M, Anderson J, Sosey M, et al. HST/WFC3: Understanding and mitigating radiation damage effects in the CCD detectors[J]. Proc. SPIE, 2016, 9904: 99045D.

    [7] [7] Shockley W, Read W T. Statistics of the recombinations of holes and electrons[J]. Phys. Rev., 1952, 87(5): 835-842.

    [10] [10] Prod’homme T, Brown A G A, Lindegren L, et al. Electrode level Monte Carlo model of radiation damage effects on astronomical CCDs[J]. Monthly Notices of the Royal Astronomical Society, 2011, 414(3): 2215-2228.

    [11] [11] Hall D, Bush N, Wood D, et al. Mapping radiation-induced defects in CCDs through space and time[J]. Proc. SPIE, 2016, 9915: 99150I.

    [12] [12] Skottfelt J, Hall D, Dryer B, et al. Importance of charge capture in interphase regions during readout of charge-coupled devices[J]. J. of Astronomical Telescopes, Instruments, and Systems, 2018, 4(1): 018005.

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    YAN Xiaopeng, WEI Jun, TANG Yuyu. CCD Charge Transfer Model and Applications Based on SRH Theory[J]. Semiconductor Optoelectronics, 2023, 44(4): 504

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    Paper Information

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    Received: Feb. 13, 2023

    Accepted: --

    Published Online: Nov. 26, 2023

    The Author Email: Jun WEI (weijun@mail.sitp.ac.cn)

    DOI:10.16818/j.issn1001-5868.2023021301

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