Journal of Semiconductors, Volume. 44, Issue 6, 062804(2023)

Investigation of β-Ga2O3 thick films grown on c-plane sapphire via carbothermal reduction

Liyuan Cheng*, Hezhi Zhang*, Wenhui Zhang*, and Hongwei Liang**
Author Affiliations
  • School of Microelectronics, Dalian University of Technology, Dalian 116024, China
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    Figures & Tables(10)
    (Color online) The simple diagram of the home-made vertical cylindrical dual temperature zone furnace.
    The growth rate of β-Ga2O3 films grown at different growth temperatures ranged from 1000 to 1350 °C.
    (Color online) Typical XRD θ–2θ scan of the β-Ga2O3 films grown on c-plane sapphire substrate at different temperatures of (a) 950 °C, (b) 1050 °C, (c) 1150 °C, (d) 1250 °C.
    The top view of SEM images of β-Ga2O3 film deposited at different growth temperatures. (a) Large area of film grown at 950 °C. Small area of film grown at (b) 950 °C, (c) 1050 °C, (d) 1350 °C.
    The growth rate of β-Ga2O3 films grown at different O2 flow ranged from 5 to 100 sccm.
    (Color online) Typical XRD θ–2θ scan of the β-Ga2O3 films grown on c-plane sapphire substrate at different O2 flow. (a) 50 sccm. (b) 20 sccm. (c) 10 sccm. (d) 5 sccm.
    The top view of SEM images of β-Ga2O3 film deposited at different O2 flow. (a) 50 sccm. (b) 20 sccm. (c) 5 sccm.
    The growth rate of β-Ga2O3 films grown at different molar ratio between graphite and Ga2O3 powder.
    (Color online) Typical XRD θ–2θ scan of the β-Ga2O3 films grown on c-plane sapphire substrate at different molar ratio between graphite powder and Ga2O3 powder. (a) 20 : 1. (b) 10 : 1. (c) 5 : 1.
    The top view of SEM images of β-Ga2O3 film deposited at different molar ratio between graphite powder and Ga2O3 powder. (a) 20 : 1. (b) 10 : 1. (c) 5 : 1.
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    Liyuan Cheng, Hezhi Zhang, Wenhui Zhang, Hongwei Liang. Investigation of β-Ga2O3 thick films grown on c-plane sapphire via carbothermal reduction[J]. Journal of Semiconductors, 2023, 44(6): 062804

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    Paper Information

    Category: Articles

    Received: Dec. 31, 2022

    Accepted: --

    Published Online: Jul. 6, 2023

    The Author Email: Cheng Liyuan (hez.zhang@dlut.edu.cn), Zhang Hezhi (hez.zhang@dlut.edu.cn), Zhang Wenhui (hez.zhang@dlut.edu.cn), Liang Hongwei (hwliang@dlut.edu.cn)

    DOI:10.1088/1674-4926/44/6/062804

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