Opto-Electronic Engineering, Volume. 47, Issue 8, 190068(2020)

Residual stress measurement methods of optics

Xiao Shilei* and Li Bincheng
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    Xiao Shilei, Li Bincheng. Residual stress measurement methods of optics[J]. Opto-Electronic Engineering, 2020, 47(8): 190068

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    Paper Information

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    Received: Oct. 9, 2019

    Accepted: --

    Published Online: Oct. 28, 2020

    The Author Email: Shilei Xiao (shilei.xiao@qq.com)

    DOI:10.12086/oee.2020.190068

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