Electro-Optic Technology Application, Volume. 27, Issue 2, 38(2012)
Carrier Transportation Characteristic and Effect in Electrochemical Corrosion of MCP
[1] [1] D R Turner, J Electrochem. Soc.105,2008.402.
[2] [2] Xiaopeng Li, Hong Seok Seo. A periodic array of silicon pillars fabricated by photoelectrochemical etching. Electrochimica Acta 54,2009. 6978-6982.
[3] [3] Wern-Dare Jehng, Jing-Chie Lin, Chien-Ming Lai,et al. Energy band diagrams for the photo-electrochemical dissolution of n-Si (100) in HF. Materials Chemistry and Physics 91, 2005. 513-517.
[4] [4] Chun-yen chang,po-lung yu Ed the. Semiconductor physics and production technology of the original. High made press. 2000. 544-562(Chinese).
[7] [7] M P Stewart, J M Buriak, Adv. Mater., 2000, 12, 859-869.
[8] [8] M J Schoning, A Kurowski, M. Thust, P Kordos, J W Schul-tze, H. Luth, Sens. Actuators, B, 2000, 64, 59-64.
[9] [9] A Steel, M Torres, J Hartwell, Y -Y Yu, N Ting, G Hoke, H Yang, in Microarray Biochip Technology (Ed. M. Schena), Bio Techniques Books, Nattick, MA, 2000, Chapter 5.
[10] [10] Liu Xue. Semiconductor physics and production technology of the original[M]. High made press. 2008:544-562.
[11] [11] HeTianWire bonding technology situation and development trend of [J]. Electronic industrial specialized equipment. 2004,33(10):3-6.
[12] [12] S KThe Gandhi, ZhangXiKang translation, etc. Very large scale integrated circuit technology principle[M]. publishing house of electronics industry,1986:411 ~ 414(Chinese).
[13] [13] Xiaoge Gregory Zhang. Silicon oxide and the electrochemi-cal[M]. Beijing: chemical press. 2004:161 ~ 165(Chinese).
[14] [14] V A Burrows, Y J Chabal, G S Higashi,et al. Infrared spectroscopy of Si( 111) surfaces after HF teratment. Hydrogen termination and suface morphology. Appl.phys. 1988, Lett.53( 11 ),998-999.
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REN Tian-yu, XUE Yang, DUANMU Qing-duo, SHI Xiao-guang, WANG Pei-ling, ZHANG Ying, LI Lu-lu. Carrier Transportation Characteristic and Effect in Electrochemical Corrosion of MCP[J]. Electro-Optic Technology Application, 2012, 27(2): 38
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Received: Feb. 23, 2012
Accepted: --
Published Online: May. 8, 2012
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