Journal of Semiconductors, Volume. 43, Issue 12, 122101(2022)
Interfacial dynamics of GaP/Si(100) heterostructure grown by molecular beam epitaxy
[18] [18] D. Keith Bowen and Tanner. B K, High resolution X-ray diffractometry and topography. Abingdon, Taylor & Francis e-Library, 1998
[21] [21] Brenner M R. GaP/Si heteroepitaxy (suppression of nucleation related defects). Ohio, The Ohio State University, 2009
Get Citation
Copy Citation Text
Tieshi Wei, Xuefei Li, Zhiyun Li, Wenxian Yang, Yuanyuan Wu, Zhiwei Xing, Shulong Lu. Interfacial dynamics of GaP/Si(100) heterostructure grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2022, 43(12): 122101
Category: Articles
Received: Jun. 12, 2022
Accepted: --
Published Online: Dec. 27, 2022
The Author Email: Li Xuefei (xfli2011@sinano.ac.cn), Lu Shulong (sllu2008@sinano.ac.cn)