Infrared and Laser Engineering, Volume. 51, Issue 2, 20210890(2022)

Measurement of translucent coating thickness based on pulsed thermography

Tao He1, Zhonghua Shen1, Fei Chen1, and Li Chen2
Author Affiliations
  • 1School of Science, Nanjing University of Science and Technology, Nanjing 210014, China
  • 2School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
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    Figures & Tables(14)
    Schematic diagram of theoretical analysis model
    Analytical surface temperature of samples with different coating thickness vs time in double logarithm scale
    Coating thickness vs peak time of surface temperature in logarithm scale
    Schematic diagram of numerical calculation model
    Coating thickness vs transmittance
    Simulation surface temperature of samples with different coating thickness vs time in double logarithm scale
    Coating thickness vs simulation peak time of surface temperature in logarithm scale
    Schematic diagram of the coating specimen
    Selected frames from the IR image sequence
    Experimental surface temperature of samples with different coating thickness vs time in double logarithm scale
    Thickness vs experimental peak time in double logarithm scale
    Test result of thickness distribution of the specimen
    • Table 1. Parameters used in the model

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      Table 1. Parameters used in the model

      Density/ $\mathrm{k}\mathrm{g}\cdot{\mathrm{m} }^{-3}$Heat capacity/ $\mathrm{J}\cdot(\mathrm{k}\mathrm{g}\cdot \mathrm{K}$)−1Thermal conductivity/ $\mathrm{W}\cdot(\mathrm{m}\cdot \mathrm{K}$)−1
      Coating120010000.2
      Substrate785047580
    • Table 2. Measurement result of coating thickness

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      Table 2. Measurement result of coating thickness

      Thickness by micrometer/ μm Thickness by thermography/ μm Difference
      110399.73.3%
      2136139.22.3%
      3158160.61.6%
      4197189.44.0%
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    Tao He, Zhonghua Shen, Fei Chen, Li Chen. Measurement of translucent coating thickness based on pulsed thermography[J]. Infrared and Laser Engineering, 2022, 51(2): 20210890

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    Paper Information

    Category: Special issue-Precision optical metrological testing

    Received: Nov. 24, 2021

    Accepted: --

    Published Online: Mar. 21, 2022

    The Author Email:

    DOI:10.3788/IRLA20210890

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