Optical Instruments, Volume. 44, Issue 5, 61(2022)
Terahertz photoinduced force near-field microscopy and application
Fig. 2. Calculated curve of gradient force varying with probe-sample distance
Fig. 6. The height and PiFM signal at the edge of MoS2 under optical excitation
Fig. 7. Scanning electron microscopy and micro-PL characterizations of MoS2
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Qiukai FENG, Xiao LIU, Guanjun YOU. Terahertz photoinduced force near-field microscopy and application[J]. Optical Instruments, 2022, 44(5): 61
Category: DESIGN AND RESEARCH
Received: Mar. 18, 2022
Accepted: Apr. 15, 2022
Published Online: Nov. 14, 2022
The Author Email: YOU Guanjun (youguanjun@126.com)