Optical Instruments, Volume. 44, Issue 5, 61(2022)

Terahertz photoinduced force near-field microscopy and application

Qiukai FENG... Xiao LIU and Guanjun YOU* |Show fewer author(s)
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • show less
    Figures & Tables(7)
    Schematic diagram of dipole model
    Calculated curve of gradient force varying with probe-sample distance
    Schematic diagram of THz PiFM
    Optical micrograph of monolayer MoS2 grains
    Topography, THz PiFM and THz s-SNOM micrograph of MoS2
    The height and PiFM signal at the edge of MoS2 under optical excitation
    Scanning electron microscopy and micro-PL characterizations of MoS2
    Tools

    Get Citation

    Copy Citation Text

    Qiukai FENG, Xiao LIU, Guanjun YOU. Terahertz photoinduced force near-field microscopy and application[J]. Optical Instruments, 2022, 44(5): 61

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: DESIGN AND RESEARCH

    Received: Mar. 18, 2022

    Accepted: Apr. 15, 2022

    Published Online: Nov. 14, 2022

    The Author Email: YOU Guanjun (youguanjun@126.com)

    DOI:10.3969/j.issn.1005-5630.2022.005.008

    Topics