High Power Laser Science and Engineering, Volume. 5, Issue 3, 03000e21(2017)
Surface characterization of ICF capsule by AFM-based profilometer
Fig. 1. Schematic of capsule profilometer setup.
Fig. 2. Photo of capsule profilometer.
Fig. 3. CCD video shots during measurement.
Fig. 4. The process steps of capsule center alignment.
Fig. 5. AFM tip and capsule.
Fig. 6. Measured surface traces in one orbit.
Fig. 7. Trace patterns for capsule measurement.
Fig. 8. Traces (a) before and (b) after capsule repositioning of
Fig. 9. Noise power spectra.
Fig. 10. Orbits covering the complete surface.
Fig. 11. Surface reconstruction with different orders.
Fig. 12. (a) Surface profile traces and (b) corresponding 1D mode-power spectrum.
Fig. 13. 2D power spectrum curve.
Fig. 14. Power spectrum curves with (a) good surface quality and (b) bad surface quality.
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Jie Meng, Xuesen Zhao, Xing Tang, Yihao Xia, Xiaojun Ma, Dangzhong Gao. Surface characterization of ICF capsule by AFM-based profilometer[J]. High Power Laser Science and Engineering, 2017, 5(3): 03000e21
Special Issue: TARGET FABRICATION
Received: Oct. 8, 2016
Accepted: May. 5, 2017
Published Online: Nov. 21, 2018
The Author Email: Dangzhong Gao (dgaocn@163.com)