Infrared and Laser Engineering, Volume. 49, Issue 5, 20190555(2020)

Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor

Jie Feng... Yudong Li, Lin Wen and Qi Guo |Show fewer author(s)
Author Affiliations
  • Laboratory of Solid State Radiation Physics, Xinjiang Technical Institute of Physics and Chemistry of Chinese Academy of Sciences, Urumqi 830011, China
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    CLP Journals

    [1] Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168

    [2] Jiawei Chen, Yudong Li, Liya Ma, Yu Li, Qi Guo. Radiation effect of 850 nm vertical-cavity surface-emitting laser[J]. Infrared and Laser Engineering, 2022, 51(5): 20210326

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    Jie Feng, Yudong Li, Lin Wen, Qi Guo. Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor[J]. Infrared and Laser Engineering, 2020, 49(5): 20190555

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    Paper Information

    Category: Deep space exploration technology

    Received: Feb. 2, 2020

    Accepted: --

    Published Online: Aug. 17, 2020

    The Author Email:

    DOI:10.3788/IRLA20190555

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