Infrared and Laser Engineering, Volume. 49, Issue 5, 20190555(2020)
Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor
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Jie Feng, Yudong Li, Lin Wen, Qi Guo. Degradation mechanism of star sensor performance caused by radiation damage of CMOS image sensor[J]. Infrared and Laser Engineering, 2020, 49(5): 20190555
Category: Deep space exploration technology
Received: Feb. 2, 2020
Accepted: --
Published Online: Aug. 17, 2020
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