Infrared and Laser Engineering, Volume. 31, Issue 4, 351(2002)

Study on micro bulk defects detection in MEMS components

[in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    References(3)

    [1] [1] You Zheng, Cher Jun, Yang Ren. Theoretic and experimental study of micro bu k defects laser detecting base on the Mie theo ry[J]. China Laser, 1997, A24(6) :508-512.

    [2] [2] Maheu B, Gouebet G, Grehan G. A concise presentation of the generalized Lorenz-Mie theory for arbitrary location of the scat ter in an arbitrary incident profile[J]. Journal of Optics, 1988, 19:57-60.

    [3] [3] Gouebet G, Grehan G, Maheu B. Localized interpretation to compute all the coefficients gn in the generalized Lorenz-Mie the ory[J]. Journal of the Optical Society in America A, 1990, 7(6) :998-1007.

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    [in Chinese], [in Chinese], [in Chinese]. Study on micro bulk defects detection in MEMS components[J]. Infrared and Laser Engineering, 2002, 31(4): 351

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    Paper Information

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    Received: Mar. 20, 2002

    Accepted: --

    Published Online: Apr. 28, 2006

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