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Acta Photonica Sinica, Volume. 34, Issue 6, 916(2005)

Micro-displacement Measuring Instrument with Semi-conductor Laser Fabry-Perot Interference Wave Length

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Micro-displacement Measuring Instrument with Semi-conductor Laser Fabry-Perot Interference Wave Length[J]. Acta Photonica Sinica, 2005, 34(6): 916

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    Received: Aug. 5, 2004

    Accepted: --

    Published Online: Jun. 12, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology