Acta Optica Sinica, Volume. 19, Issue 6, 800(1999)

Effects of Roughness on Characterization of Soft X-Ray Multilayer Coating

[in Chinese], [in Chinese], and [in Chinese]
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    References(3)

    [1] [1] Stearns D G, Rosen R S, Vernon S P. Multilayer mirror technology for soft X-ray projection lithography. Appl. Opt., 1993, 32(34):6952~6960

    [2] [2] Henke B L, Lee P, Tanaka T J et al.. The atomic scattering factor, f1+if2, for 94 elements and for the 100 to 2000 eV photon energy region. AIP Conference Proceedings, 1981, (75):340~388

    [3] [3] Michette A G. Optical Systems for Soft X Rays. New York: Plenum Press, 1986.

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    [1] Jia Hongbao, Sun Jinghua, Xu Yao, Wu Dong, Lü Haibing, Yan Lianghong, Yuan Xiaodong. Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2 Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra[J]. Acta Optica Sinica, 2012, 32(8): 831001

    [2] Hou Haihong, Shen Jian, Zhang Dawei, Fan Zhengxiu. Study on Surface Roughness of Substrates under Different Cleaning Techniques by Total Integrated Scatter[J]. Chinese Journal of Lasers, 2009, 36(6): 1559

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    [in Chinese], [in Chinese], [in Chinese]. Effects of Roughness on Characterization of Soft X-Ray Multilayer Coating[J]. Acta Optica Sinica, 1999, 19(6): 800

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    Paper Information

    Category: Thin Films

    Received: Mar. 31, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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