Opto-Electronic Engineering, Volume. 32, Issue 9, 43(2005)
New depth recovery algorithm in modulation measurement profilometry
[1] [1] Mitsuo TAKEDA,Kazuhiro MUTOH. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Applied Optics,1983,22(24):3977-3982.
[2] [2] V. SRINIVASAN,H. C. LIU,Maurice HALIOUA. Automated phase-measuring profilometry:a phase mapping approach[J]. Applied Optics,1985,24(2):185-188.
[5] [5] Likun SU,Xianyu SU,Wangsong LI,et al. Application of modulation measurement profilometry to objects with surface holes[J]. Applied Optics,1999,38(7):1153-1158.
[6] [6] Xian-Yu SU,Li-Kun SU,Wansong LI. A new Fourier transform profilometry based on modulation measurement[J]. SPIE,1999,3749:438-439.
[7] [7] Shree K. NAYAR,Yasuo NAKAGAWA. Shape from focus[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence,1994,16(8):824-831.
Get Citation
Copy Citation Text
[in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43