New depth recovery algorithm in modulation measurement profilometry

Opto-Electronic Engineering, Volume. 32, Issue 9, 43(2005)

[in Chinese]^1,2 and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese]. New depth recovery algorithm in modulation measurement profilometry[J]. Opto-Electronic Engineering, 2005, 32(9): 43

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Received: Sep. 16, 2004

Accepted: --

Published Online: Nov. 14, 2007

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