Acta Optica Sinica, Volume. 15, Issue 9, 1258(1995)
Precision Analysis of Phase-Modulation Method for Measuring Stress Birefringence of Optical-Disk Substrate
References(0)
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese]. Precision Analysis of Phase-Modulation Method for Measuring Stress Birefringence of Optical-Disk Substrate[J]. Acta Optica Sinica, 1995, 15(9): 1258
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20