Infrared and Laser Engineering, Volume. 32, Issue 4, 359(2003)

Research on the technology measurement of length by double wavelength laser interference using phase shift

[in Chinese]*
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    [in Chinese]. Research on the technology measurement of length by double wavelength laser interference using phase shift[J]. Infrared and Laser Engineering, 2003, 32(4): 359

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    Received: Jan. 18, 2003

    Accepted: Mar. 19, 2003

    Published Online: Apr. 28, 2006

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