Infrared and Laser Engineering, Volume. 45, Issue 12, 1204002(2016)

Secondary development of Ansys to the infrared diagnosis of irregular inner-wall surface defect of complex material based on inverse heat conduction problem

Lv Shigui*, Yang Zaiqing, and Cong Shuquan
Author Affiliations
  • [in Chinese]
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    References(13)

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    Lv Shigui, Yang Zaiqing, Cong Shuquan. Secondary development of Ansys to the infrared diagnosis of irregular inner-wall surface defect of complex material based on inverse heat conduction problem[J]. Infrared and Laser Engineering, 2016, 45(12): 1204002

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    Paper Information

    Category: 红外技术及应用

    Received: Apr. 12, 2016

    Accepted: May. 20, 2016

    Published Online: Jan. 12, 2017

    The Author Email: Shigui Lv (shiguilv@hotmail.com)

    DOI:10.3788/irla201645.1204002

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