Optics and Precision Engineering, Volume. 22, Issue 1, 220(2014)
Fast focus on simple images
[1] [1] SHEN H, LI S X, GU D Y, et al.. Bearing defect inspection based on machine vision [J]. Measurement,2012,45(4): 719-733.
[2] [2] SHAHABI H H, RATNAM M M. Noncontact roughness measurement of turned parts using machine vision [J]. Int J Adv Manuf Technol,2010,46(1-4): 275-284.
[5] [5] GADELMAWLA E S. Computer vision algorithms for measurement and inspection of spur gears [J]. Measurement,2011,44(9): 1669-1678.
[6] [6] PARK J B,LEE J G,LEE M K,et al.. A glass thickness measuring system using the machine vision method [J]. International Journal of Precision Engineering and Manufacturing,2011, 12(5): 769-774.
[7] [7] SUN Y,DUTHALER S,NELSON B J.Auto-focusing in computer microscopy: selecting the optimal focus algorithm [J].Microscopy Research and Technique,2004,65(3): 139-149.
[8] [8] VU P V,CHANDLER D M. A fast wavelet-based algorithm for global and local image sharpness estimation [J]. IEEE Signal Processing Letters,2012,19(7): 423-426.
[9] [9] ZONG G H, SUN M L, BI S S, et al.. Research on wavelet based autofocus evaluation in micro-vision [J]. Chinese Journal of Aeronautics, 2006,19 (3): 239-246.
[10] [10] LI M M, WANG X S, LI J. Comparative study on the auto-focus definition function based on the image processing [J]. Infrared and Laser Engineering, 2010, 39(Supp.): 244-248.(in Chinese)
[11] [11] LIU Y P, JIN J, WANG Q, et al.. Phases measure of image sharpness based on quaternion wavelet [J]. Pattern Recognition Letters,2013,34(9): 1063-1070.
[12] [12] DONG D, LIU R, SUN M L, et al.. Auto-focusing algorithm based on cross correlation [J]. Journal of Beijing University of Aeronautics and Astronautics, 2006, 32(3): 306-310. (in Chinese)
[14] [14] RUDNAYA M E, TER MORSCHE H G, MAU-
BACH J M L, et al.. A derivative-based fast autofocus method in electron microscopy [J].J Math Imaging Vis.,2012,44(1): 38-51.
Get Citation
Copy Citation Text
CHEN Fang, ZHANG Cun-ji, HAN Yan-xiang, SHI Jin-fei. Fast focus on simple images[J]. Optics and Precision Engineering, 2014, 22(1): 220
Category:
Received: May. 13, 2013
Accepted: --
Published Online: Feb. 18, 2014
The Author Email: Fang CHEN (fchen@seu.edu.cn)