Journal of Synthetic Crystals, Volume. 49, Issue 9, 1569(2020)

Thermal Transport Study of Engineered Synthetic Crystal Microstructures

GENG Zhiming1... DI Chen1, FANG Ke1, ZHAN Ruonan1, YUAN Ziyuan1, YAN Xuejun1,*, LU Hong1,2, LU Minghui1,2, and CHEN Yanfeng12 |Show fewer author(s)
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    With the rapid advances of the electronics industry and energy science, thermal management has grown as a key issue to be addressed in multiple areas, including microelectronics, thermal logic devices and thermoelectric technologies. Especially in the semiconductor industry, the demand for thermal dissipation of the chips with ever growing power densities goes far beyond the capability even for the cutting-edge thermal management technologies, which turns out to be a bottleneck for further developments. Such issues call for more comprehensive understandings about thermal transport mechanisms, with extended research focuses on macroscale to microscale. In this review, we take the microstructures into account of thermal transport mechanisms, with the perspectives of diffusive and ballistic thermal transports. Various strategies are thus raised to engineer the thermal transport in the microstructures, as proved to be effective. In this review, focuses are set on point defect, quantum dot, superlattice and especially on interface engineering, in which the intrinsic thermal transport mechanisms are studied as well. With recent research progresses as a reference, it is evident that the rich synthetic material microstructures offer opportunities to strategies on thermal transport engineering. In spite of the challenges from complex device structures, corresponding explorations and studies are further needed.

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    GENG Zhiming, DI Chen, FANG Ke, ZHAN Ruonan, YUAN Ziyuan, YAN Xuejun, LU Hong, LU Minghui, CHEN Yanfeng. Thermal Transport Study of Engineered Synthetic Crystal Microstructures[J]. Journal of Synthetic Crystals, 2020, 49(9): 1569

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    Paper Information

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    Received: --

    Accepted: --

    Published Online: Nov. 11, 2020

    The Author Email: Xuejun YAN (xjyan@nju.edu.cn;陈延峰|yfchen@nju.edu.cn)

    DOI:

    CSTR:32186.14.

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