Optics and Precision Engineering, Volume. 16, Issue 1, 42(2008)

30.4 nm filter in normal incidence imager

[in Chinese]1...2, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1 and [in Chinese]1 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    References(4)

    [1] [1] SCHULZE D W,SANDEL B R.Multilayer mirrors and filters for imaging the earth's inner magnetosphere[J].SPIE,1991,1549:319-328.

    [2] [2] KORTRIGH J B,UNDERWOOD J H.Design considerations for multilayer coated Schwarzschild objectives for the XUV[J].SPIE,1990,1343:95-103.

    [7] [7] SANSONETTI J E,MARTIN W C,YOUNG S L.Handbook of basic atomic spectroscopic data(version 1.1)[DB/OL].Gaithersburg:National Institute of Standards and Technology,2004[2004-10-08].http://phsics.nist.gov/Handbook

    [8] [8] POWELL F R,DRAKE V A.Selection of materials for soft X-ray (SXR) and extreme ultraviolet (EUV) filters for space astronomy and other applications[J].SPIE,1994,2209:480-490.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 30.4 nm filter in normal incidence imager[J]. Optics and Precision Engineering, 2008, 16(1): 42

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 22, 2007

    Accepted: --

    Published Online: Jul. 8, 2008

    The Author Email:

    DOI:

    Topics