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Optics and Precision Engineering, Volume. 16, Issue 1, 42(2008)

30.4 nm filter in normal incidence imager

[in Chinese]1,2, [in Chinese]1,2, [in Chinese]1,2, [in Chinese]1, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 30.4 nm filter in normal incidence imager[J]. Optics and Precision Engineering, 2008, 16(1): 42

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    Received: May. 22, 2007

    Accepted: --

    Published Online: Jul. 8, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology