Opto-Electronic Engineering, Volume. 33, Issue 10, 108(2006)

Automatic blemish inspection for TFT-LCD based on polynomial surface fitting

[in Chinese] and [in Chinese]
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    References(6)

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    [2] [2] Y.MORI,K.TANAHASHHI.Extraction and evaluation of mura in liquid crystal displays[J].SPIE,2001,4471:299-306.

    [3] [3] LI Wen-ju,LIANG De-qun,CUI Lian-yan,et al.A novel approach for vehicle license plate tilt correction[J].Information and Control,2004,33(2):231-235.

    [4] [4] CHENG Zheng-xing.Data fitting[M].Xi(an:Xi(an Jiaotong University Press,1986.

    [5] [5] SHEN Kui-chang.Implementation of best polynomial approximation[M].Shanghai:Shanghai Science & Technology Press,1984.

    [6] [6] Yumi MORI,Ryoji YOSHITAKE,Tohru TAMURA.Evaluation and discrimination method of 'mura' in liquid crystal displays by just noticeable difference observation[J].SPIE,2002,4902:715-722.

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    [in Chinese], [in Chinese]. Automatic blemish inspection for TFT-LCD based on polynomial surface fitting[J]. Opto-Electronic Engineering, 2006, 33(10): 108

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    Paper Information

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    Received: Oct. 9, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

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