Optics and Precision Engineering, Volume. 20, Issue 8, 1789(2012)
Measurement of continuous bending deformation for circuit boards by digital holographic interferometry
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YANG De-xing, XU Zeng-qi, JIANG Hong-zhen, FU Yong-hui, WANG Jun, SHAO Zhao-shen, ZHAO Jian-lin. Measurement of continuous bending deformation for circuit boards by digital holographic interferometry[J]. Optics and Precision Engineering, 2012, 20(8): 1789
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Received: Mar. 13, 2012
Accepted: --
Published Online: Sep. 4, 2012
The Author Email: De-xing YANG (dxyang@nwpu.edu.cn)
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