Optics and Precision Engineering, Volume. 20, Issue 8, 1789(2012)

Measurement of continuous bending deformation for circuit boards by digital holographic interferometry

YANG De-xing1、*, XU Zeng-qi1, JIANG Hong-zhen1, FU Yong-hui2, WANG Jun1, SHAO Zhao-shen2, and ZHAO Jian-lin1
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  • 1[in Chinese]
  • 2[in Chinese]
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    The measurement of continuous bending deformation for a circuit board surface was achieved by using digital off-axis Fresnel holographic interferometry. 1 501 holograms were recorded by applying a displacement load to both ends of the circuit board from 0 to 15 mm by the step of 0.01 mm.The interference phase difference was obtained by subtracting the complex amplitude phase distributions of two adjacent holograms with numerical reconstruction. Then, the out-of-plane displacement of the lighting measurement area was obtained according to the relationship between the phase difference and the out-of-plane displacement, and the measurement results were obtained by accumulating the bending deformation of the displacement load from 1 mm to 15 mm. By calculating the out-of-plane displacements of the same capacitor center in the lighting measurement area from five pieces of circuit boards with the same specifications, it indicates that the measurement results are no more than 0.008 mm for the type A uncertainty,no more than 0.003 5 mm for the type B uncertainty from a loading clamp and no more than 0.008 7 mm for the combined uncertainty. The results show that the method based on digital off-axis Fresnel holographic interferometry for measuring the continuous bending deformation of the object with a large displacement load has good repeatability and stability.

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    YANG De-xing, XU Zeng-qi, JIANG Hong-zhen, FU Yong-hui, WANG Jun, SHAO Zhao-shen, ZHAO Jian-lin. Measurement of continuous bending deformation for circuit boards by digital holographic interferometry[J]. Optics and Precision Engineering, 2012, 20(8): 1789

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    Paper Information

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    Received: Mar. 13, 2012

    Accepted: --

    Published Online: Sep. 4, 2012

    The Author Email: De-xing YANG (dxyang@nwpu.edu.cn)

    DOI:10.3788/ope.20122008.1789

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