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Acta Optica Sinica, Volume. 39, Issue 6, 0634001(2019)

Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source

Geng Niu1,2, Junbiao Liu1,2、*, Weixia Zhao1, Li Han1,2, and Yutian Ma1,2
Author Affiliations
  • 1 Laboratory of Superconductors and New Materials, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing 100190, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
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    Article index updated:May. 21, 2024

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    Geng Niu, Junbiao Liu, Weixia Zhao, Li Han, Yutian Ma. Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source[J]. Acta Optica Sinica, 2019, 39(6): 0634001

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    Paper Information

    Category: X-Ray Optics

    Received: Jan. 15, 2019

    Accepted: Mar. 11, 2019

    Published Online: Jun. 17, 2019

    The Author Email: Liu Junbiao (liujb@mail.iee.ac.cn)

    DOI:10.3788/AOS201939.0634001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology