Acta Optica Sinica, Volume. 39, Issue 6, 0634001(2019)
Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source
Microfocus X-ray source is the core component of micro-computed tomography (micro-CT). This study investigates the relationship between the changes in the focal spot size and intensity of the transmission microfocus X-ray source caused by the lateral diffusion of the electron beam in the target. Results show that, if the density distribution of the electron beam follows a Gaussian distribution, the distribution of the X-ray intensity should also be Gaussian. The standard deviation of the X-ray intensity distribution exactly represents the size of the X-ray focal spot. Furthermore, results show that when the energy deposition of the electron beam in the target reaches 60%, the intensity of the X-ray produced by the target reaches the maximum value, correspondingly. With an increase in the target thickness, the focal spot size of the X-ray source gradually increases; conversely, an increase in the acceleration voltage of the electron beam can appropriately reduce the focal spot size of the X-ray source. This study provides theoretical guidance for target material selection and design of transmission microfocus X-ray source.
Get Citation
Copy Citation Text
Geng Niu, Junbiao Liu, Weixia Zhao, Li Han, Yutian Ma. Effect of Focused Bombarding Electron Beam on Transmission Microfocus X-Ray Source[J]. Acta Optica Sinica, 2019, 39(6): 0634001
Category: X-Ray Optics
Received: Jan. 15, 2019
Accepted: Mar. 11, 2019
Published Online: Jun. 17, 2019
The Author Email: Liu Junbiao (liujb@mail.iee.ac.cn)