Journal of Semiconductors, Volume. 45, Issue 9, 091101(2024)

Recent progress on fabrication, spectroscopy properties, and device applications in Sn-doped CdS micro-nano structures

Bo Cao1,2, Ye Tian1,2、*, Huan Fei Wen1,2、**, Hao Guo1,2, Xiaoyu Wu3、***, Liangjie Li1,2, Zhenrong Zhang1,2, Lai Liu1,2, Qiang Zhu1,2, Jun Tang1,2、****, and Jun Liu1,2、*****
Author Affiliations
  • 1State Key Laboratory of Dynamic Measurement Technology, School of Semiconductors and Physics, North University of China, Taiyuan 030051, China
  • 2Shanxi Province Key Laboratory of Quantum Sensing and Precision Measurement, North University of China, Taiyuan 030051, China
  • 3School of Instrument Science and Technology, Xi'an Jiaotong University, Xi'an 710049, China
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    Bo Cao, Ye Tian, Huan Fei Wen, Hao Guo, Xiaoyu Wu, Liangjie Li, Zhenrong Zhang, Lai Liu, Qiang Zhu, Jun Tang, Jun Liu. Recent progress on fabrication, spectroscopy properties, and device applications in Sn-doped CdS micro-nano structures[J]. Journal of Semiconductors, 2024, 45(9): 091101

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    Paper Information

    Category: Articles

    Received: Apr. 29, 2024

    Accepted: --

    Published Online: Oct. 11, 2024

    The Author Email: Tian Ye (YTian), Wen Huan Fei (HFWen), Wu Xiaoyu (XYWu), Tang Jun (JTang), Liu Jun (JLiu)

    DOI:10.1088/1674-4926/24040041

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