Acta Photonica Sinica, Volume. 42, Issue 11, 1345(2013)
Noise Factors Model of Electron Multiplying CCD and Test Methods
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ZHANG Wenwen, QIAN Yuehong, CHEN Qian, GU Guohua. Noise Factors Model of Electron Multiplying CCD and Test Methods[J]. Acta Photonica Sinica, 2013, 42(11): 1345
Paper Information
Received: Jul. 9, 2013
Accepted: --
Published Online: Dec. 16, 2013
The Author Email: Wenwen ZHANG (zhangwenwen1205@163.com)
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