Laser & Optoelectronics Progress, Volume. 61, Issue 8, 0812008(2024)
Defect Detection of Photovoltaic Cells Based on Improved YOLOv8
Figures & Tables(17)
Fig. 2. Images generated by GauGAN. (a) Semantic segmentation mask; (b) images generated when epoch is 100; (c) images generated when epoch is 200
Fig. 10. Comparison of predicted results. (a) Large scale crack; (b) star crack; (c) thick line; (d) finger interruption and small scale crack
Table 1. Dataset details
View tableTable 1. Dataset details
Defect type Crack Star crack Thick line Finger Total Small and medium scale Large scale Before
expansion
Label number 1028 104 252 1189 2918 5491 Image number 907 104 219 775 1492 3497 After
expansion
Label number 1821 300 633 1189 2918 6861 Image number 1700 300 600 775 1492 4867
Table 2. Comparison of data enhancement effects
View tableTable 2. Comparison of data enhancement effects
Dataset F1 Recall /% Precision /% mAP@0.5 /% Average mAP@0.5 /% Average mAP@0.5∶0.95 /% Crack Star crack Thick line Finger Before expansion 80.25 76.41 85.19 80.47 75.84 85.18 94.06 83.89 49.50 After expansion 82.75 77.29 86.93 84.05 80.63 85.81 94.34 86.21 52.00
Table 3. CAM improvement experimental results
View tableTable 3. CAM improvement experimental results
Model Params /106 Flops /109 F1 Recall /% Precision /% mAP@0.5 /% mAP@0.5∶0.95 /% YOLOv8 11.14 14.28 82.75 77.29 86.93 86.21 52.00 YOLOv8+FAM 12.95 15.22 82.50 77.66 89.44 87.92 53.30 YOLOv8+FBM 11.31 14.29 83.00 79.47 86.97 87.54 54.00 YOLOv8+FBM+FAM 13.04 15.23 82.00 78.09 88.25 88.56 53.50 YOLOv8+FAM+FBM 13.04 15.23 84.50 79.50 90.52 88.79 54.00
Table 4. MADH improvement experimental results
View tableTable 4. MADH improvement experimental results
Model Params /106 Flops /109 F1 Recall /% Precision /% mAP@0.5 /% mAP@0.5∶0.95 /% YOLOv8 11.14 14.28 82.75 77.29 86.93 86.21 52.00 YOLOv8+CA 11.03 13.97 83.75 78.35 87.42 87.64 54.70 YOLOv8+SE 10.69 13.04 83.25 80.76 86.47 85.99 52.90 YOLOv8+CCA 10.71 13.07 84.75 82.06 87.87 87.44 52.50 YOLOv8+CA+CCA 10.59 12.76 84.00 81.79 86.60 88.35 54.20
Table 5. Ablation experimental results
View tableTable 5. Ablation experimental results
Model Params /106 Flops /109 FPS /（frame/s） F1 Recall /% Precision /% mAP@0.5 /% mAP@0.5∶0.95 /% YOLOv8 11.14 14.28 81.25 82.75 77.29 86.93 86.21 52.00 YOLOv8+CAM 13.04 15.23 74.06 84.50 79.50 90.52 88.79 54.00 YOLOv8+MADH 10.59 12.76 78.96 84.00 81.79 86.60 88.35 54.20 YOLOv8-EL 13.13 15.43 73.30 84.25 79.90 90.12 89.90 54.70
Table 6. Comparison test results
View tableTable 6. Comparison test results
Model Params /106 Flops /109 F1 Recall /% Precision /% mAP@0.5 /% mAP @0.5∶0.95 /% Faster R-CNN 28.31 253.5 58.83 68.85 75.07 75.80 42.30 YOLO5-s 7.03 15.82 68.75 56.63 90.52 82.80 45.40 YOLO5-m 21.07 25.22 77.50 72.07 84.28 85.42 50.60 YOLOX-s 8.90 26.84 83.00 82.11 84.75 86.43 49.40 YOLOX-m 28.50 39.44 83.75 84.37 83.43 88.05 52.80 YOLOv7-tiny 6.07 13.32 78.75 71.28 89.27 85.84 48.30 YOLOv7-m 37.76 59.53 83.00 76.55 83.71 87.39 50.30 YOLOv8-s 11.14 14.28 82.75 77.29 86.93 86.21 52.00 YOLOv8-m 25.86 39.44 84.60 83.86 85.56 88.77 53.70 YOLOv8-s-EL 13.13 15.43 84.25 79.90 90.12 89.90 54.70 YOLOv8-m-EL 29.71 41.51 86.00 87.49 89.41 90.58 55.20
Table 7. Generalization performance experimental results
View tableTable 7. Generalization performance experimental results
Model F1 Recall /% Precision /% mAP@0.5 /% mAP@0.5：0.95 /% Faster R-CNN 78.25 80.68 82.01 79.70 51.30 YOLOv5-s 74.50 64.31 90.02 84.14 55.90 YOLOv5-m 83.45 77.74 90.28 86.38 63.60 YOLOX-s 81.10 80.22 82.29 84.83 58.00 YOLOX-m 83.70 84.13 83.37 88.08 63.90 YOLOv7-tiny 80.00 71.98 90.48 85.82 59.40 YOLOv7-m 87.80 86.21 89.93 90.02 68.10 YOLOv8-s 84.70 82.70 87.21 88.09 66.00 YOLOv8-m 87.50 87.33 87.83 90.72 70.20 YOLOv8-s-EL 84.45 80.74 88.99 90.11 67.30 YOLOv8-m-EL 88.15 86.45 90.18 92.88 72.30
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Ying Zhou, Yuze Yan, Haiyong Chen, Shenghu Pei. Defect Detection of Photovoltaic Cells Based on Improved YOLOv8[J]. Laser & Optoelectronics Progress, 2024, 61(8): 0812008
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Jun. 28, 2023
Accepted: Jul. 31, 2023
Published Online: Mar. 22, 2024
The Author Email: Chen Haiyong (haiyong.chen@hebut.edu.cn)
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