Laser & Optoelectronics Progress, Volume. 61, Issue 8, 0812008(2024)

Defect Detection of Photovoltaic Cells Based on Improved YOLOv8

Ying Zhou1,2, Yuze Yan1, Haiyong Chen1,2、*, and Shenghu Pei1
Author Affiliations
  • 1School of Artificial Intelligence and Data Science, Hebei University of Technology, Tianjin 300130, China
  • 2Hebei Control Engineering Technology Research Center, Tianjin 300130, China
  • show less

    A YOLOv8-based defect detection algorithm, YOLOv8-EL, is proposed to address the problems of false detection and missing detection caused by data imbalance, varied defect scales, and complex background textures in photovoltaic (PV) cell defect detection. First, GauGAN is used for data augmentation to address the issue of intra-class and inter-class imbalance, improve model generalization ability, and reduce the risk of overfitting. Second, a context aggregation module is embedded between the backbone network and the feature fusion network to adaptively fuse semantic information from different levels, align local features, reduce the loss of minor defect information, and suppress irrelevant background interference. Finally, a multi-attention detection head is constructed to replace the decoupling head, introducing different attention mechanisms to refine classification and localization tasks, extract key information at the spatial and channel levels, and reduce feature confusion. Experimental results show that the proposed model achieves an average precision of 89.90% on the expanded PV cell EL dataset with a parameter count of 13.13×106, achieving both precision improvement and lightweight deployment requirements. Generalization experiments on the PASCAL VOC dataset demonstrate the improved algorithm's generalization performance.

    Tools

    Get Citation

    Copy Citation Text

    Ying Zhou, Yuze Yan, Haiyong Chen, Shenghu Pei. Defect Detection of Photovoltaic Cells Based on Improved YOLOv8[J]. Laser & Optoelectronics Progress, 2024, 61(8): 0812008

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 28, 2023

    Accepted: Jul. 31, 2023

    Published Online: Mar. 22, 2024

    The Author Email: Chen Haiyong (haiyong.chen@hebut.edu.cn)

    DOI:10.3788/LOP231622

    Topics