On-line characterization of individual particles from automobile emission by ATOFMS

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Quantum Electronics, Volume. 22, Issue 5, 754(2005)

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. On-line characterization of individual particles from automobile emission by ATOFMS[J]. Chinese Journal of Quantum Electronics, 2005, 22(5): 754

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Paper Information

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Received: Jun. 9, 2004

Accepted: --

Published Online: May. 15, 2006

The Author Email: (wwzhao@aiofm.ac.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

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