High Power Laser Science and Engineering, Volume. 11, Issue 4, 04000e49(2023)
Phase imaging of irradiated foils at the OMEGA EP facility using phase-stepping X-ray Talbot–Lau deflectometry
Fig. 1. (a) Schematic drawing of the experimental setup. The figure shows the different elements of the interferometer together with the backlighter target, the plasma target and the corresponding laser beams. In this figure, corresponds to the source grating, is the beamsplitter and is the analyzer grating described in the text. The dot-dashed line across all elements corresponds to the optical axis of the interferometer. Note that the distances indicated between the different elements are not to scale. (b) Schematic drawing describing how the phase-stepping procedure works. The grating is displaced perpendicular to the instrument axis and grating bars, scanning over one full grating period () after steps. In this schematic, only four steps in a period are shown and the rotation angle of with respect to has been exaggerated for clarity (in our experimental setup, this angle was ).
Fig. 2. (a) Example of
Fig. 3. Interferometry image of the ablated plasma. The dark vertical feature around corresponds to the CH foil. Note that the direction of the phase-change detection coincides with the Moiré fringes, which are oriented horizontally in our experiment. The region indicated with the red-dashed square corresponds to the field of view of the reference images and, therefore, to the region that was analyzed. The region within the white-dotted square corresponds to the region of consideration, after removing the edges to avoid the Gibbs phenomenon and possible grating imperfections. Similar to
Fig. 4. (a) Cropped region from the interferometry data corresponding to the field of view of the reference images (red square in
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G. Pérez-Callejo, V. Bouffetier, L. Ceurvorst, T. Goudal, S. R. Klein, D. Svyatskiy, M. Holec, P. Perez-Martin, K. Falk, A. Casner, T. E. Weber, G. Kagan, M. P. Valdivia. Phase imaging of irradiated foils at the OMEGA EP facility using phase-stepping X-ray Talbot–Lau deflectometry[J]. High Power Laser Science and Engineering, 2023, 11(4): 04000e49
Category: Research Articles
Received: Jan. 26, 2023
Accepted: May. 19, 2023
Published Online: Jul. 10, 2023
The Author Email: G. Pérez-Callejo (gabriel.perez.callejo@uva.es), G. Kagan (g.kagan@imperial.ac.uk), M. P. Valdivia (mpvaldivialeiva@ucsd.edu)