Optics and Precision Engineering, Volume. 13, Issue z1, 173(2005)

Automatic defect detection based on ESPI

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    References(7)

    [3] [3] SCHNARS U,JUPTNER W P O.Digital recording and numerical reconstruction of holograms[J].Meas.Sci.Technol.,2002,13:R85-R101.

    [4] [4] BRUNING J H,HERRIOTT D R,GALLAGHER D P,et al.Simultaneous measurement of whole in-plane displacement using phase-shifting ESPI[J].Optics and Lasers in Engineering,1997,28(4):249-257.

    [5] [5] FRICKE-BEGEMANN T,BURKE J.Speckle interferometry:three-dimensional deformation field measurement with a single interferogram[J].Applied Optics,2001,40(28):5011-5022.

    [9] [9] KAO CH CH,YEH G B,LEE SH SH,et al.Phase-shifting algorithms for electronic speckle pattern interferometry[J].Applied Optics,2002,41(1):46-54.

    [10] [10] BURKE J,HELMERS H.Matched data storage in ESPI by combination of spatial phase shifting with temporal phase unwrapping[J].Optics and Laser Technology,2000,32:235-240.

    [11] [11] VIKHAGEN E.TV holography:spatial resolution and signal resolution in deformation analysis[J].Applied Optics,1991,30(4):420-425.

    [12] [12] VIKHAGEN E,Lokberg O J.Speckle averaging in deformation analysis using video speckle interferometry[J].Optics and Laser in Engineering,1997,27:179-190.

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    [in Chinese], [in Chinese], [in Chinese]. Automatic defect detection based on ESPI[J]. Optics and Precision Engineering, 2005, 13(z1): 173

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    Published Online: Nov. 3, 2006

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