High Power Laser and Particle Beams, Volume. 36, Issue 6, 064002(2024)

Calibration technology of intense pulse electron beam position monitor

Qin Li... Zhaoyi Zhang, Wei Jiang, Yunlong Liu, Yongwei Wang and Quanhong Long |Show fewer author(s)
Author Affiliations
  • Key Laboratory of Pulsed Power, Institute of Fluid Physics, CAEP, Mianyang 621900, China
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    Figures & Tables(15)
    Relative position sketch of beam pipe, beam position and resistive ring monitor (RRM)
    Sketch of beam position monitor calibration system
    Comparatison between set positions and calculated positions of different calibration in condition of n=1
    Comparison between set positions and calculated positions of different calibration in condition of n=4
    Characteristic plane and calibration results
    Measurment of resistive ring monitor in calibration system and signal processing result
    Position error distribution in x direction in different calibration position span and range
    Set position and measured position of different calibration method
    • Table 1. Calculated results of different normalization, calibration and polynomial fit

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      Table 1. Calculated results of different normalization, calibration and polynomial fit

      monitor parameternormalizationcalibrationaverage of absolute value of position error/mm
      n=1n=2n=3n=4
      s1=1minus/sumno calibration2.772.772.772.77
      s2=1planar0.170.7523.0423.93
      s3=1.05axis0.230.231.751.67
      s4=0.945° line0.220.243.633.74
      Δx0=0log rationo calibration2.852.852.852.85
      Δy0=0planar0.060.067.567.56
      θx=0axis0.080.080.610.61
      θy=045° line0.070.071.201.20
      s1=1minus/sumno calibration3.003.003.003.00
      s2=1planar0.192.4426.9228.27
      s3=1axis0.250.502.151.75
      s4=145° line0.270.373.672.92
      Δx0=1 mmlog rationo calibration3.003.003.003.00
      Δy0=−2 mmplanar0.060.828.909.45
      θx=0axis0.090.170.760.75
      θy=045° line0.090.111.171.18
      s1=1minus/sumno calibration0.570.570.570.57
      s2=1planar0.181.665.305.40
      s3=1.05axis0.390.401.041.03
      s4=0.945° line0.550.562.041.97
      Δx0=1 mmlog rationo calibration0.390.390.390.39
      Δy0=−2 mmplanar0.060.841.821.94
      θx=0.03 radaxis0.370.370.490.49
      θy=0.04 rad45° line0.500.500.550.55
    • Table 2. Calculated results of different monitor parameter and calibration in conditions of log ratio and n=1

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      Table 2. Calculated results of different monitor parameter and calibration in conditions of log ratio and n=1

      monitor parameteraverage of absolute value of position error/mm
      no calibrationplanaraxis45° line
      s1=1.05, s2=0.9, s3=0.8, s4=1.1; Δx0=0, Δy0=0; θx =0, θy =08.740.060.080.07
      s1=s2=1, s3=1, s4=1;Δx0=-3 mm, Δy0=4 mm, θx =0,θy =04.000.050.060.06
      s1=s2=1, s3=1, s4=1; Δx0=0, Δy0=0,θx =-0.04 rad, θy =0.05 rad0.210.030.210.24
      s1=1.05, s2=0.9, s3=0.8, s4=1.1;Δx0=-3 mm, Δy0=4 mm, θx =-0.04 rad, θy =0.05 rad2.370.100.510.60
      s1=s2=1, s3=1.05, s4=0.9;Δx0=1 mm, Δy0=-2 mm, θx =0.03 rad, θy =0.04 rad0.390.060.370.50
    • Table 3. Comparison between characteristic plane calibration and others

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      Table 3. Comparison between characteristic plane calibration and others

      monitor parametersaverage of absolute value of position error/mm
      s1=s2=1, s3=1.05, s4=0.9; Δx0=1 mm, Δy0=−2 mm; θx=0.03 rad, θy =0.04 radno calibrationplanaraxis45° linecharacteristic plane
      1 mm/point2 mm/point3 mm/point
      0.39050.06340.37010.49850.06490.06530.0659
    • Table 4. Processing results of line calibration experiment in different position span and range

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      Table 4. Processing results of line calibration experiment in different position span and range

      span and rangenormalizationklx(1)klx (0)kly(1)kly(0)xerror/mmyerror/mm
      0.5 mm/point−10 mm~10 mmminus/sum83.380.1594.621.630.04370.0479
      log ratio20.660.1723.351.620.02300.0284
      1 mm/point−10 mm~10 mmminus/sum83.390.1594.651.630.04370.0483
      log ratio20.650.1723.341.620.02320.0285
      3 mm/point−10 mm~10 mmminus/sum83.240.1694.641.630.04420.0487
      log ratio20.640.1723.341.620.02340.0284
      0.5 mm/point−8 mm~8 mmminus/sum82.950.1694.021.630.04510.0499
      log ratio20.620.1823.291.620.02440.0304
      0.5 mm/point−6 mm~6 mmminus/sum82.410.1793.631.630.05940.0587
      log ratio20.550.1823.271.630.03360.0333
    • Table 5. Processing results of characteristic plane calibration experiment in different position span and range

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      Table 5. Processing results of characteristic plane calibration experiment in different position span and range

      spanrangekpx(0)kpx(1)kpx(2)kpy(0)kpy(1)kpy(2)xerror/mmyerror/mm
      1 mm/point±10 mm0.0821.47−1.22−0.241.2122.120.02490.0218
      2 mm/point±10 mm0.0821.47−1.22−0.241.2122.120.02510.0224
      3 mm/point±10 mm0.0821.47−1.22−0.241.2122.120.02540.0218
      1 mm/point±10 mm0.0821.47−1.22−0.241.2122.120.02530.0218
      1 mm/point±8 mm0.0821.47−1.22−0.241.2122.120.02550.0228
      1 mm/point±6 mm0.0821.47−1.22−0.241.2122.120.02490.0218
    • Table 6. Processing results of plane calibration experiment in different position range

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      Table 6. Processing results of plane calibration experiment in different position range

      position range/mmkpx(0)kpx(1)kpx(2)kpy(0)kpy(1)kpy(2)xerror/mmyerror/mm
      ±100.2421.51−1.19−0.271.2121.910.02350.0222
      ±80.2521.50−1.19−0.271.2221.920.02370.0223
      ±60.2521.55−1.16−0.271.2021.910.02660.0225
      ±40.2621.66−1.15−0.271.2021.810.04380.0302
    • Table 7. Processing results of plane calibration experiment using different calibration method

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      Table 7. Processing results of plane calibration experiment using different calibration method

      calibrationkx(0)kx(1)kx(2)ky(0)ky(1)ky(2)xerror/mmyerror/mm
      45° line0.2320.44−0.3223.330.37780.4463
      −45° line0.2422.84−0.2520.870.42390.3751
      axis0.2421.56−0.2921.910.29760.3086
      characterictic plane0.2521.50−1.21−0.271.2121.920.02430.0224
      plane0.2421.51−1.19−0.271.2121.910.02350.0222
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    Qin Li, Zhaoyi Zhang, Wei Jiang, Yunlong Liu, Yongwei Wang, Quanhong Long. Calibration technology of intense pulse electron beam position monitor[J]. High Power Laser and Particle Beams, 2024, 36(6): 064002

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    Paper Information

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    Received: Jan. 24, 2024

    Accepted: Mar. 29, 2024

    Published Online: Jun. 3, 2024

    The Author Email:

    DOI:10.11884/HPLPB202436.240034

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