Infrared and Laser Engineering, Volume. 34, Issue 5, 592(2005)
Image restoration in T-ray imaging based on wavelet de-noising
[1] [1] Hu B B, Nuss M C. Imaging with terahertz waves [J]. Optics Letters,1995,20(16): 1716-1718.
[2] [2] Mittleman D M, Rune H, Nuss M C. T-ray imaging [J]. IEEE Journal of Selected Topics in Quantum Electronics, 1996,2(3):679-692.
[3] [3] Mickan S, Abbott D, Munch J, et al. Analysis of system tradeoff for terahertz imaging [J].Microelectronics Journal,1999,31(7):503-514.
[4] [4] Hunsche S, Koch M, Brener I, et al. THz near-field imaging[J].Optics Communications, 1998,150: 22-26.
[5] [5] Chen Q,Zhang X C.Semiconductor dynamic aperture for near-fild terahertz wave imaging [J].IEEE Journal on Selected Topics in Quantum Electronics, 2001,7(4):608-614.
[6] [6] Yuna T,Xu J Z, Zhang X C.Development of terahertz wave microscopes [J].Infrared Physics and Technology,2004,45:417-425.
[7] [7] Cai Y,Brener I,Lopata Let al.Coherent terahertz radiation detection: direct comparison between free-space electro-optic sampling and antenna detection[J].Applied Physics Letters,1998, 73 : 1604-1606.
[8] [8] Gonzalez R C,Wintz P.Digital Image Processing [M]. New York:Addison -Wesley, 1977.221 -225.
[9] [9] Stephane Mallat.A Wavelet Tour of Signal Processing [M].Carolina: Academic Press,1999.344-346.
[10] [10] Ninness B. Estimation of 1/f noise [J]. IEEE Transactions on Information Theory, 1998,44(1):32-46.
[11] [11] Jansen M,Malfait M, Bultheel A. Generalization cross validation for wavelet thresholding [J].Signal Process,1997,56:463-479.
[12] [12] Schildknecht C,Kleine-Ostmann T,Knohloch P,et al.Numerical image enhancement for THz time-domain spectroscopy[A].Terahertz Electronics Proceedings,IEEE Tenth International Confefence [C].USA: IEEE, 2002.57-160.
[13] [13] Huang T S.Picture Pressing Digital Filtering [M]. London:Springer -Verlag, 1979.242-244.
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[in Chinese], [in Chinese]. Image restoration in T-ray imaging based on wavelet de-noising[J]. Infrared and Laser Engineering, 2005, 34(5): 592