Infrared and Laser Engineering, Volume. 33, Issue 6, 666(2004)

Automatic X-ray cephalometric measuring and analysis system

[in Chinese]* and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(6)

    [1] [1] Levy-mandel A D, Venetsanopoulos A N, Tsotsos J K. Knowledge-based landmarking of cephalograms[J]. Computer and Biomedical, 1986,19(3): 282-309.

    [2] [2] Rudolph D J, Sinclair P M, Coggins J M, Automatic computerized radiographic identification of cephalometric landmarks[J].American Journal of Orthodontics and Dentofacial Orthopedics,1998,113(2) :173-179.

    [5] [5] Mallat S G. Mutifrequency channel decompositions of images and wavelet models [J]. IEEE Transactions on Acoustics,Speech,and Signal Processing , 1989,37(12) :2091-2109.

    [6] [6] Shen D. Discriminative wavelet shape descriptors for recognition of 2-D patterns[J]. Pattern Recognition, 1999,32(10): 151-165.

    [8] [8] Canny J. A computational approach to edge detection[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence,1986,8(6) :679-698.

    [9] [9] Tagare H D. Deformable 2-D template matching using orthogonal curves[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1997,16(1): 108-117.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese]. Automatic X-ray cephalometric measuring and analysis system[J]. Infrared and Laser Engineering, 2004, 33(6): 666

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 23, 2003

    Accepted: Feb. 10, 2004

    Published Online: May. 25, 2006

    The Author Email:

    DOI:

    Topics