Infrared and Laser Engineering, Volume. 33, Issue 6, 666(2004)
Automatic X-ray cephalometric measuring and analysis system
[1] [1] Levy-mandel A D, Venetsanopoulos A N, Tsotsos J K. Knowledge-based landmarking of cephalograms[J]. Computer and Biomedical, 1986,19(3): 282-309.
[2] [2] Rudolph D J, Sinclair P M, Coggins J M, Automatic computerized radiographic identification of cephalometric landmarks[J].American Journal of Orthodontics and Dentofacial Orthopedics,1998,113(2) :173-179.
[5] [5] Mallat S G. Mutifrequency channel decompositions of images and wavelet models [J]. IEEE Transactions on Acoustics,Speech,and Signal Processing , 1989,37(12) :2091-2109.
[6] [6] Shen D. Discriminative wavelet shape descriptors for recognition of 2-D patterns[J]. Pattern Recognition, 1999,32(10): 151-165.
[8] [8] Canny J. A computational approach to edge detection[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence,1986,8(6) :679-698.
[9] [9] Tagare H D. Deformable 2-D template matching using orthogonal curves[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1997,16(1): 108-117.
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[in Chinese], [in Chinese]. Automatic X-ray cephalometric measuring and analysis system[J]. Infrared and Laser Engineering, 2004, 33(6): 666