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INFRARED, Volume. 41, Issue 3, 1(2020)

Research on Surface Defects of Short.Wave Infrared InGaAs Detector Materials

Yu.hang JIN1...2, Wei.guo HUANG3, Jian ZHANG3, Hong.zhen WANG2, Yi GU2,3 and Xun.jun HE1,* |Show fewer author(s)
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    JIN Yu.hang, HUANG Wei.guo, ZHANG Jian, WANG Hong.zhen, GU Yi, HE Xun.jun. Research on Surface Defects of Short.Wave Infrared InGaAs Detector Materials[J]. INFRARED, 2020, 41(3): 1

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    Received: Feb. 6, 2020

    Accepted: --

    Published Online: Jan. 27, 2021

    The Author Email: Xun.jun HE (hexunjun@hrbust.edu.cn)

    DOI:10.3969/j.issn.1672-8785.2020.03.001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology