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Electronics Optics & Control, Volume. 23, Issue 6, 90(2016)

A Method for Testability Verification of Armament Based on Data of Service Stage

YU Long-hai, SHI Xian-jun, and XIAO Zhi-cai
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    [8] [8] OTTAVI M. Evaluating the yield of repairable SRAMs for ATE［J］. IEEE Transactions on Instrumentation and Mea-surement, 2006, 55(10):1704-1712.

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    YU Long-hai, SHI Xian-jun, XIAO Zhi-cai. A Method for Testability Verification of Armament Based on Data of Service Stage[J]. Electronics Optics & Control, 2016, 23(6): 90

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    Paper Information

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    Received: Jun. 5, 2015

    Accepted: --

    Published Online: Jan. 28, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2016.06.020

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology