Laser & Optoelectronics Progress, Volume. 58, Issue 17, 1726001(2021)
Investigating the Mueller Matrix of Objects at Different Incident Angles
Fig. 1. Schematic of Mueller matrix measuring device
Fig. 2. Variation curves of Mueller matrix elements with incident angle. (a) m00; (b) m01/m00; (c) m10/m00; (d) m11/m00; (e) m22/m00; (f) m23/m00; (g) m32/m00; (h) m33/m00
Fig. 3. Variation curves of different characteristics with incident angle.(a)Diattenuation property;(b)polarizance property;(c)retardance property;(d)depolarization property
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Siyuan He, Zhiyin Zhou, Xiaofan Tian, Ange Wang, Yan Wang, Zhe Song. Investigating the Mueller Matrix of Objects at Different Incident Angles[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1726001
Category: Physical Optics
Received: Nov. 19, 2020
Accepted: Jan. 6, 2021
Published Online: Sep. 14, 2021
The Author Email: Song Zhe (zhesongkeke@163.com)