Journal of Synthetic Crystals, Volume. 52, Issue 8, 1378(2023)
Stress Field Analysis of Diamond Wire Sawing β-Ga2O3 Crystal
[7] [7] WU C H, JIANG Z F, FAN W, et al. Finite element analysis of multi-wire saw silicon rods with consolidated abrasive diamonds[J]. The International Journal of Advanced Manufacturing Technology, 2017, 90(1): 241-248.
[9] [9] CHENG D M, GAO Y F, LIU R T. Finite element analysis on processing stress of polysilicon cut by diamond multi-wire saw[J]. Materials Science in Semiconductor Processing, 2021, 131: 105860.
[10] [10] BHAGAVAT S, KAO I. A finite element analysis of temperature variation in silicon wafers during wire saw slicing[J]. International Journal of Machine Tools and Manufacture, 2008, 48(1): 95-106.
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LI Zongping, CHENG Dameng. Stress Field Analysis of Diamond Wire Sawing β-Ga2O3 Crystal[J]. Journal of Synthetic Crystals, 2023, 52(8): 1378
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Received: Mar. 16, 2023
Accepted: --
Published Online: Oct. 28, 2023
The Author Email: Zongping LI (lzp85775@163.com)
CSTR:32186.14.