Journal of Synthetic Crystals, Volume. 52, Issue 8, 1378(2023)

Stress Field Analysis of Diamond Wire Sawing β-Ga2O3 Crystal

LI Zongping1、* and CHENG Dameng2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(4)

    [7] [7] WU C H, JIANG Z F, FAN W, et al. Finite element analysis of multi-wire saw silicon rods with consolidated abrasive diamonds[J]. The International Journal of Advanced Manufacturing Technology, 2017, 90(1): 241-248.

    [9] [9] CHENG D M, GAO Y F, LIU R T. Finite element analysis on processing stress of polysilicon cut by diamond multi-wire saw[J]. Materials Science in Semiconductor Processing, 2021, 131: 105860.

    [10] [10] BHAGAVAT S, KAO I. A finite element analysis of temperature variation in silicon wafers during wire saw slicing[J]. International Journal of Machine Tools and Manufacture, 2008, 48(1): 95-106.

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    LI Zongping, CHENG Dameng. Stress Field Analysis of Diamond Wire Sawing β-Ga2O3 Crystal[J]. Journal of Synthetic Crystals, 2023, 52(8): 1378

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    Paper Information

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    Received: Mar. 16, 2023

    Accepted: --

    Published Online: Oct. 28, 2023

    The Author Email: Zongping LI (lzp85775@163.com)

    DOI:

    CSTR:32186.14.

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